Characterization of CE and CEC processes under pure kinetic conditions by linear‐sweep voltammetry

  1. Mellado, J.M.R.
  2. Montoya, M.R.
Revue:
Electroanalysis

ISSN: 1521-4109 1040-0397

Année de publication: 1994

Volumen: 6

Número: 11-12

Pages: 1132-1135

Type: Article

DOI: 10.1002/ELAN.1140061136 GOOGLE SCHOLAR