Fabric defect detection using the wavelet transform in an ARM processor

  1. Fernández, J.A.
  2. Orjuela, S.A.
  3. Álvarez, J.
  4. Philips, W.
Proceedings of SPIE - The International Society for Optical Engineering

ISSN: 0277-786X

ISBN: 9780819489470

Year of publication: 2012

Volume: 8300

Type: Conference paper

DOI: 10.1117/12.909432 GOOGLE SCHOLAR