Test Bench for Highly Segmented GRIT Double-Sided Silicon Strip Detectors: A Detector Quality Control Protocol

1. Dueñas, J.A.
2. Cobo, A.
3. López, L.
4. Galtarossa, F.
5. Goasduff, A.
6. Mengoni, D.
7. Sánchez-Benítez, A.M.

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DOI: 10.3390/S23125384 GOOGLE SCHOLAR lock_openOpen access editor

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