Test Bench for Highly Segmented GRIT Double-Sided Silicon Strip Detectors: A Detector Quality Control Protocol

  1. Dueñas, J.A.
  2. Cobo, A.
  3. López, L.
  4. Galtarossa, F.
  5. Goasduff, A.
  6. Mengoni, D.
  7. Sánchez-Benítez, A.M.
Aldizkaria:
Sensors

ISSN: 1424-8220

Argitalpen urtea: 2023

Alea: 23

Zenbakia: 12

Mota: Artikulua

DOI: 10.3390/S23125384 GOOGLE SCHOLAR lock_openSarbide irekia editor
Datuen iturria: Scopus