Test Bench for Highly Segmented GRIT Double-Sided Silicon Strip Detectors: A Detector Quality Control Protocol

  1. Dueñas, J.A.
  2. Cobo, A.
  3. López, L.
  4. Galtarossa, F.
  5. Goasduff, A.
  6. Mengoni, D.
  7. Sánchez-Benítez, A.M.
Revue:
Sensors

ISSN: 1424-8220

Année de publication: 2023

Volumen: 23

Número: 12

Type: Article

DOI: 10.3390/S23125384 GOOGLE SCHOLAR lock_openAccès ouvert editor
La source de données: Scopus