Cryogenic reliability impact on analog circuits at extreme low temperatures
- Chen, Yuan
- Westergard, Lynett
- Billman, Curtis
- Leon, Rosa
- Vo, Tuan
- White, Mark
- Mojarradi, Mohammad
- Kolawa, Elizabeth
ISSN: 1541-7026
ISBN: 978-1-4244-0918-1
Datum der Publikation: 2007
Seiten: 156-158
Kongress: 45th Annual IEEE International Reliability Physics Symposium
Art: Konferenz-Beitrag