Cryogenic reliability impact on analog circuits at extreme low temperatures

  1. Chen, Yuan
  2. Westergard, Lynett
  3. Billman, Curtis
  4. Leon, Rosa
  5. Vo, Tuan
  6. White, Mark
  7. Mojarradi, Mohammad
  8. Kolawa, Elizabeth
Book Series:
2007 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM PROCEEDINGS - 45TH ANNUAL

ISSN: 1541-7026

ISBN: 978-1-4244-0918-1

Year of publication: 2007

Pages: 156-158

Congress: 45th Annual IEEE International Reliability Physics Symposium

Type: Conference paper

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Data source: WoS