Cryogenic reliability impact on analog circuits at extreme low temperatures

  1. Chen, Yuan
  2. Westergard, Lynett
  3. Billman, Curtis
  4. Leon, Rosa
  5. Vo, Tuan
  6. White, Mark
  7. Mojarradi, Mohammad
  8. Kolawa, Elizabeth
Liburu bilduma:
2007 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM PROCEEDINGS - 45TH ANNUAL

ISSN: 1541-7026

ISBN: 978-1-4244-0918-1

Argitalpen urtea: 2007

Orrialdeak: 156-158

Biltzarra: 45th Annual IEEE International Reliability Physics Symposium

Mota: Biltzar ekarpena

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Datuen iturria: WoS