Cryogenic reliability impact on analog circuits at extreme low temperatures

  1. Chen, Yuan
  2. Westergard, Lynett
  3. Billman, Curtis
  4. Leon, Rosa
  5. Vo, Tuan
  6. White, Mark
  7. Mojarradi, Mohammad
  8. Kolawa, Elizabeth
Colección de libros:
2007 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM PROCEEDINGS - 45TH ANNUAL

ISSN: 1541-7026

ISBN: 978-1-4244-0918-1

Ano de publicación: 2007

Páxinas: 156-158

Congreso: 45th Annual IEEE International Reliability Physics Symposium

Tipo: Achega congreso

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Fonte de datos: WoS