Cryogenic reliability impact on analog circuits at extreme low temperatures

  1. Chen, Yuan
  2. Westergard, Lynett
  3. Billman, Curtis
  4. Leon, Rosa
  5. Vo, Tuan
  6. White, Mark
  7. Mojarradi, Mohammad
  8. Kolawa, Elizabeth
Collection de livres:
2007 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM PROCEEDINGS - 45TH ANNUAL

ISSN: 1541-7026

ISBN: 978-1-4244-0918-1

Année de publication: 2007

Pages: 156-158

Congreso: 45th Annual IEEE International Reliability Physics Symposium

Type: Communication dans un congrès

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La source de données: WoS